设备列表

X-Ray

2-D X-Ray Imaging 二维X光成像

3-D X-Ray Tomography 三维 X光断层摄影

C-SAM

Confocal-Scanning Acoustic Microscope 扫描声学显微镜

De-Capsulation

开封

FIB(+SEM)

Focused Ion Beam 聚焦离子束

CP

Cross-Section polisher 截面抛光仪

TEM

Transmission Electron Microscopy 透射电子显微镜

EELS

Electron Energy Loss Spectroscopy 电子能量损失谱

FE SEM

Field Emission SEM 场发射扫描电子显微镜

SEM-EDS/ EBSD

SEM/EDS/EBSD : Scanning Electron Microscope 扫描电子显微镜 /Energy Dispersive Spectrometer 能量色散谱仪 (EDS)/ Electron Backscattered Diffraction 电子背散射衍射

EPMA

Electron Probe Micro-analyzer 电子探针

SPM/AFM

Scanning Probe Microscopy/Atomic Force Microscopy 扫描探针显微镜/ 原子力显微镜

XRF

X-Ray Fluorescence 全反射X射线荧光

XPS/ESCA

X-Ray Photoelectron Spectroscopy/ Electron Spectroscopy for Chemical Analysis X射线光电子能谱/ 化学分析电子能谱

SIMS

Secondary Ion Mass Spectrometry 二次离子质谱

TOF-SIMS

Time-of-Flight Secondary Ion Mass Spectrometry 飞行时间-二次离子质谱

AES

Auger Electron Spectroscopy 俄歇电子能谱

FTIR

Micro Fourier Transform Infrared Spectroscopy 显微傅里叶变换红外光谱

GDMS

Glow Discharge Mass Spectrometry 辉光放电质谱

ICP-MS

Inductively Coupled Plasma Mass Spectrometry 电感藕合等离子体质谱

Raman

Raman Spectroscopy 拉曼光谱

XRD

X-Ray Diffraction X射线衍射

LPC

Liquid Particle Counter 液体颗粒计数仪

IC

Ion chromatograph 离子色谱仪

GC-MS

Gas Chromatography Mass Spectrometry 气相色谱质谱联用仪

Dynamic Headspace Sampler 动态顶空进样器 (DHS)

Static Headspace Sampler 静态顶空进样器 (SHS)

Thermal cracking injector热裂解进样器 (Pyrolysis)

DSC

Differential Scanning Calorimeter 差示扫描量热仪

TGA

Thermogravimetric Analyzer 热失重分析仪

TMA

Thermomechanical Analyzer 静态热机械分析仪

DMA

Dynamic Thermomechanical Analyze 动态热机械分析仪